- 190 to 1150 nm, Silicon detector
- 650 to 1800 nm, InGaAs detector
- 1000 to 2300 or 2500 nm, InGaAs (extended) detector
|Model||Measured Sources||Resolution Accuracy||Gain Range||Update Rate||Additional information|
|BeamMap2||CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]||0.1 µm or 0.05% of scan range ± < 2% ± = 0.5 µm||1000:1 Switched 4096:1 ADC range||~5 Hz||View source|
|BeamMap2-CM||CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]||0.1 µm or 0.05% of scan range ± < 2% ± = 0.5 µm||1000:1 Switched 4096:1 ADC range||~5 Hz||View source|
The BeamMap2 allows you to measure the M² factor in real-time. With the unique design of the BeamMap2 profiler scan head, it is also possible to measure the position of the centroid in XY on each plane and the focal position in Z. The multi-plane based slit scanning also enables you to calculate the beam direction and divergence.
The ability to rotate the scan head along the laser beam axis means that measurements of astigmatism and M² in different axis of the beam are possible. An integrated encoder shows the effective angle in the software.